title: Electron-microscope study of the effect of chlorhexidine on Pseudomonas aeruginosa.
abstract: Electron micrographs of cytological damage to log phase Pseudomonas aeruginosa caused by low consentrations of chlorhexidine indicate an action primarily on the cytoplasmic membrane at concentration of 2.0--3.0 micrograms/ml chlorhexidine, and on the cytoplasmic membrane plus layers external to it at concentrations greater than 3.0 micrograms/ml. Evidence of two types of resistance to chlorhexidine is presented.
mesh_terms: D002462:Cell Membrane / Q000187:drug effects; D002710:Chlorhexidine / Q000494:pharmacology*; D008854:Microscopy, Electron; D011550:Pseudomonas aeruginosa / Q000187:drug effects* / Q000254:growth & development / Q000648:ultrastructure
chemical_list: D002710:Chlorhexidine