title: SIMS study of element concentration profiles in enamel and dentin.
abstract: The ion probe technique has been employed for the determination of the concentrations of P, F, Cl, C, Na, K, Mg, Sr, Al, and Si at different depths in human tooth. The applicability of the method depends selectively on the element's position in the periodic table, but may be regarded as good for a wide range of microelements of dental interest.
mesh_terms: D003743:Dental Enamel / Q000032:analysis*; D003804:Dentin / Q000032:analysis*; D004602:Elements / Q000032:analysis*; D006801:Humans; D013058:Mass Spectrometry / Q000379:methods; D014131:Trace Elements / Q000032:analysis*
chemical_list: D004602:Elements; D014131:Trace Elements