title: Some repair effectiveness coefficients as indicators of E. coli UV-resistance.
abstract: Mathematical studies of E. coli survival curves to UV (254 nm) lead to the definition of a photoresistance parameter - the "mean survival dose" (MSD) - to compare radiation resistances of genetically related bacterial strains. Based on this MSD-parameter some repair coefficients were proposed as indicators of the relative effectiveness with which every repair system recovers radiation lesions in cells. The theoretical values calculated for the proposed coefficients are in agreement with those which were obtained from experimental data presented in the literature.
mesh_terms: D004260:DNA Repair / Q000528:radiation effects*; D004926:Escherichia coli / Q000235:genetics* / Q000528:radiation effects; D008433:Mathematics; D014466:Ultraviolet Rays