Reparable and irreparable damage in yeast cells induced by sparsely ionizing radiation.
It is shown that in diploid yeast there are significant differences in the extent of irreparable damage after irradiation with X-rays, 60Co-gamma-rays and 30 MeV electrons. At extremely low dose rates, 60Co-gamma-rays were found to produce almost no irreparable damage at least up to 1200 Gy. X-rays, however, at the same low dose rate caused irreparable damage in the same dose range yielding a surviving fraction of 0.25 at 1200 Gy. For irradiations at high dose rate followed by liquid holding recovery the relative biological effectiveness of X-rays amounted to at least 4 for absorbed doses of up to 1000 Gy. With 30 MeV electrons at high dose rates an accumulation of sublethal and potentially lethal damage resulting in irreparable damage occurred above 1000 Gy. It is suggested that irreparable damage in yeast is due to a cooperative effect of neighbouring track ends.
D004260:DNA Repair / Q000528:radiation effects*; D004171:Diploidy; D004307:Dose-Response Relationship, Radiation; D004583:Electrons; D005720:Gamma Rays; D007399:Interphase / Q000528:radiation effects; D012062:Relative Biological Effectiveness; D012441:Saccharomyces cerevisiae / Q000254:growth & development / Q000528:radiation effects*; D014965:X-Rays