title: Stereological analysis in scanning electron microscopy.
abstract: The traditional field of stereological analysis based on quantitative image analysis data is expanded to include scanning electron microscopy (SEM). Two major methodological advances enable useful results to be obtained: 1) Image recording of backscattered electrons using an annular semi-conductor detector; 2) Direct link between SEM and image analyser by means of an on-line coupling providing synchronisation of both sub-systems.
mesh_terms: D003201:Computers; D008855:Microscopy, Electron, Scanning / Q000379:methods*; D013690:Television; D014965:X-Rays