A resistance monitor with power cut-off for automatic regulation of shadow and support film thickness in freeze-etching and related techniques.
A resistance monitor with sensors and automatic power cut-off has been developed to control the thickness of Pt-C shadow and C replica films in freeze-etching and related techniques. The monitor and sensors, in conjunction with newly modified evaporators, should considerably reduce the amount of C and Pt required and should prove useful in other applications employing vacuum evaporation of thin films of Pt, C, or other conducting materials.
D002462:Cell Membrane / Q000648:ultrastructure; D005612:Freeze Drying; D005613:Freeze Etching / Q000295:instrumentation* / Q000379:methods; D005614:Freeze Fracturing; D010984:Platinum; D014027:Tobacco Mosaic Virus / Q000648:ultrastructure; D015003:Yeasts / Q000648:ultrastructure
D010984:Platinum