title: Reduction of background [corrected] due to backscattered electron in energy-dispersive X-ray microanalysis.
abstract: When energy-dispersive X-ray microanalysis is practised in a scanning electron microscope, most of the spectral background may come from electrons entering the detector. This background can be eliminated by deflecting magnets. Alternatively, the electrons can be blocked by a plastic film but only at the cost of suppression of the low-energy end of the X-ray spectrum.
mesh_terms: D004583:Electrons; D008280:Magnetics; D008855:Microscopy, Electron, Scanning; D013052:Spectrometry, X-Ray Emission / Q000295:instrumentation*