title: [Possibilities and limits of electron microscopy (author's transl)].
abstract: This review evaluates the electron microscopical imaging techniques used today. Reviewed are transmission method, indirect imaging of surfaces by replica and surface decoration, and direct imaging of surfaces by means of scanning, emission, and mirror electron microscopy. For each method the respective limit of resolution and the possibilities of application are described. Especially, the methods of high-resolution and of high-voltage electron microscopical techniques will be pointed out as being actual means of investigation stressing electron microscopy up to the limits given by physics and technique.
mesh_terms: D003461:Crystallography; D008854:Microscopy, Electron / Q000379:methods; D008855:Microscopy, Electron, Scanning
vernacular_title: Möglichkeiten und Grenzen der Elektronenmikroskopie.