Stress analysis of porous rooted dental implants.
A model based on a continuously bonded interface predicts high punching stresses at the apex of the implant and low stresses in the cortical plates. A model based on a continuously bonded interface predicts high stiffness and a resultant low implant displacement-load ratio. A model based on a tissue ingrowth-bonded interface predicts uniform distribution of stresses around the implant through the cortical plates. A model based on a tissue ingrowth-bonded interface predicts an implant displacement-load ratio close to the ratio measured with actual implant specimens.
D000539:Alveolar Process / Q000502:physiology; D000818:Animals; D002858:Chromium Alloys; D003757:Dental Implantation / Q000295:instrumentation*; D003799:Dental Stress Analysis; D004285:Dogs; D004548:Elasticity; D066298:In Vitro Techniques; D008954:Models, Biological; D013499:Surface Properties
D002858:Chromium Alloys