title: A preparatory technique for examination of imperfect fungi by scanning electron microscopy.
abstract: Thin 12 mm diameter coverslips, coated with nutrient agar, were inoculated with a fungus, incubated, and sequentially examined with the light microscope and then the scanning electron microscope (SEM), thus providing the valuable capability of correlation of results obtained from these two microscopic analyses. A sandwich of two coverslips was prepared for light-microscopic observations, and then separated and the agar-coated coverslip on which the fungus had grown was passed through fixative solutions, critical point dried, metal-coated and examined in the SEM. The technique was designed primarily for studies of conidiogenesis in rapidly growing human pathogenic imperfect fungi.
mesh_terms: D002176:Candida albicans / Q000648:ultrastructure; D003455:Cryptococcus neoformans / Q000648:ultrastructure; D003584:Cytological Techniques; D005848:Geotrichum / Q000648:ultrastructure; D008855:Microscopy, Electron, Scanning; D003904:Mitosporic Fungi / Q000648:ultrastructure*; D012248:Rhodotorula / Q000648:ultrastructure; D013048:Specimen Handling