A simple technique for examining frozen hydrated specimens in the scanning electron microscope.
The use of a wide angle backscattered electron detector in a scanning electron microscope, which has the capability of the specimen chamber pressure being controlled independently of the column pressure, provides a simple technique for examining frozen hydrated specimens. Large specimens have been examined within 1 min of being placed on the stub and have been examined for many hours without charging artefacts or distortion due to dehydration.
D005615:Freezing; D008855:Microscopy, Electron, Scanning / Q000379:methods*; D013048:Specimen Handling