title: [The effect of the magnification ratio on 2 methods of computerized image analysis in scanning electron microscopy].
abstract: The aim of this study is to compare two computerized analysis methods of SEM dentinal walls views. The first technic is an indirect one using a primary marking and a secondary measurement. The second one is a direct threshold analyse, using the grey levels selection. The influence of the magnification is analysed in a second part. The first technic is considered as a reference one. The results show that the threshold measurement technic is only reliable at a high magnification. A direct surface measurement cannot be used at a low magnification. A pretreatment could enhance the ability of a computer to measure the areas covered with smear-layer or organic debris on SEM micrographs.
authors.affiliation: Département d'Odontologie Conservatrice-Endodontie, Faculté de Chirurgie-Dentaire, Toulouse III, France.
authors.forename: P
authors.initials: P
authors.lastname: Guignes
authors.forename: J
authors.initials: J
authors.lastname: Faure
authors.forename: A
authors.initials: A
authors.lastname: Maurette
mesh_terms: D003804:Dentin / Q000648:ultrastructure; D005069:Evaluation Studies as Topic; D006801:Humans; D007091:Image Processing, Computer-Assisted / Q000295:instrumentation / Q000379:methods*; D008855:Microscopy, Electron, Scanning / Q000295:instrumentation / Q000379:methods*; D013499:Surface Properties
vernacular_title: Influence du rapport d'agrandissement sur deux méthodes d'analyse informatisée d'image de microscopie électronique à balayage.