title: Resonance-enhanced x-rays in thin films: a structure probe for membranes and surface layers.
abstract: An x-ray resonance effect in an organic thin film on an x-ray reflecting mirror is reported. The resonance effect is the result of interference between reflected and refracted x-rays at the air-organic thin film interface and occurs at incident angles slightly above the critical angle of the film. In excellent agreement with theory, the primary resonant x-ray electric field that is confined in the organic thin film is approximately 20 times as intense as the electric field of the incident beam when measured at a position close to the center of the film. Resonance-enhanced x-rays can be used to characterize the internal structure of Langmuir-Blodgett thin film membranes. This effect may also find use in x-ray-based thin film devices and in the structural analysis of adlayers and surfaces that have thus far proved difficult, if not impossible, to study because of sensitivity limitations.
authors.affiliation: Department of Chemistry, Ohio State University, Columbus 43210.
authors.forename: J
authors.initials: J
authors.lastname: Wang
authors.forename: M J
authors.initials: MJ
authors.lastname: Bedzyk
authors.forename: M
authors.initials: M
authors.lastname: Caffrey
mesh_terms: D004577:Electron Probe Microanalysis; D005453:Fluorescence; D008567:Membranes, Artificial; D013499:Surface Properties; D014965:X-Rays; D015032:Zinc
chemical_list: D008567:Membranes, Artificial; D015032:Zinc