title: The effect of thin K-edge filters on radiation dose in dental radiography.
abstract: The use of thin K-edge filters has been found to reduce considerably the radiation dose in intra-oral radiography. The aim of this study was to investigate the effect of filtration on the skin entrance dose and several sites (representing organs or areas of interest within the head) along the central beam axis, at other points within the primary beam and at two points just outside the primary beam. The subject was a sliced head phantom (a human skull embedded in tissue-equivalent material) which was exposed to X rays from a conventional dental X-ray unit in the range of tube voltage 55-85 kVp for each of four filter systems. These were 2.7 mm of aluminium alone (the existing total filtration) or with an added 0.1 mm erbium, 0.1 mm yttrium or 0.05 mm niobium metal foils. Measurements of radiation dose were made using thermoluminescent dosemeters (TLD rods) and were adjusted to simulate the exposure resulting from a typical dental radiograph of a maxillary molar. The results suggest that the use of thin K-edge filters significantly reduces the entrance skin dose and to a certain extent reduces the total dose imparted to the head. However, the dose to the ipsilateral orbit at higher tube voltages may be increased.
authors.affiliation: Department of Dental Radiology, King's College School of Medicine and Dentistry, London, UK.
authors.forename: D S
authors.initials: DS
authors.lastname: MacDonald-Jankowski
authors.forename: C P
authors.initials: CP
authors.lastname: Lawinski
mesh_terms: D000535:Aluminum; D002610:Cheek; D004871:Erbium; D005374:Filtration / Q000295:instrumentation*; D006801:Humans; D008406:Masseter Muscle / Q000528:radiation effects; D008961:Models, Structural; D009061:Mouth Mucosa / Q000528:radiation effects; D009556:Niobium; D009915:Orbit / Q000528:radiation effects; D014066:Palatine Tonsil / Q000528:radiation effects; D011829:Radiation Dosage; D011861:Radiography, Dental / Q000295:instrumentation*; D012867:Skin / Q000528:radiation effects; D015019:Yttrium
chemical_list: D009556:Niobium; D015019:Yttrium; D004871:Erbium; D000535:Aluminum