title: Automatic focus correction for spot-scan imaging of tilted specimens.
abstract: The variation in defocus within an image of a highly tilted specimen can be a serious source of artifact. Spot-scan imaging can be combined with dynamic focusing to greatly reduce this range of defocus. A protocol is described for determining the parameters required for the automatic focus compensation during the recording of a spot-scan image. Images of a gold test specimen demonstrate the efficacy of this procedure in extending the area of the image that contains high-quality data. In case the tilt angle or resolution is high enough that the height difference of the specimen within each small illuminated area is larger than the depth of field, the image must be treated to compensate for the focus variation. The same principle is used as was developed for compensation of conventional images of tilted specimens.
authors: Life Sciences Division, Lawrence Berkeley Laboratory, Berkeley, CA 94720.
authors: K H
authors: KH
authors: Downing
mesh_terms: D016477:Artifacts; D007089:Image Enhancement / Q000379:methods*; D007091:Image Processing, Computer-Assisted / Q000379:methods; D008855:Microscopy, Electron, Scanning / Q000295:instrumentation / Q000379:methods*; D008962:Models, Theoretical