title: Preparation of cross-section specimens for transmission electron microscopy from alpha-Al2O3/Ni solid state bonded bicrystal interfaces.
abstract: The technique which is described combines the advantages of the techniques formerly proposed in the literature in each stage of the preparation of transmission electron microscopy (TEM) specimens including a single metal-ceramic interface. It allows easy handling of the thin foils in spite of their brittleness. Preferential thinning of the softer material in the two-phase foil is prevented, and both sides of the interface are thinned down to comparable thicknesses. The nickel-alumina bicrystal interface observed in TEM is neat and free from any reaction layer. This method is easily adaptable to other metal-ceramic systems.
authors: Laboratoire de Thermodynamique et Physico-Chimie Métallurgiques, Domaine Universitaire, Saint Martin d'Hères, France.
authors: C
authors: C
authors: Wan
authors: M
authors: M
authors: Dupeux
mesh_terms: D000537:Aluminum Oxide; D003460:Crystallization; D007204:Indium; D008854:Microscopy, Electron / Q000379:methods*; D009532:Nickel
chemical_list: D007204:Indium; D009532:Nickel; D000537:Aluminum Oxide