title: The effect on dose of kilovoltage x-rays backscattered from lead.
abstract: Dose enhancement on the backscatter side of a soft tissue/high Z material interface is known to exist for megavoltage x-ray beams. Caused by an increase in backscattered electron fluence, the enhancement persists for short distances upstream of the interface, equal to the range of these electrons. Since photon interaction cross sections are small, there is little photon backscatter at these energies. Consequently, beyond the range of the backscattered electrons, the dose upstream is unaffected by the presence of the interface. A similar dose enhancement has been reported for kilovoltage beams. In this case, due to the very low energy of the backscattered electrons, the enhancement persists for a very short upstream distance. Since photon interaction cross sections at keV energies are relatively large, there is also a substantial backscattered photon fluence. This experimental work investigates the effect of these photons on dose at distances upstream from a water/lead interface beyond the range of the backscattered electrons. Measurements of ionization charge, as a function of interface distance and field size for 60, 100, and 250 kV beams, were made with a parallel plate chamber at a fixed depth. A significant underdose was found upstream of the interface compared to a homogeneous water medium. For example, with the 100 kV beam and a 15 x 15 cm2 field the measured underdose is 23% at 3 mm and 14% at 1.5 cm upstream of the interface. The effect decreases with field size. In fact, for a 2 x 2 cm2 field the upstream dose in unaffected by the interface. Detailed results for this and the other two beams are presented along with backscatter factor measurements for lead. An explanation for the observed underdose is also presented.
authors.affiliation: Department of Therapeutic Radiology, Yale University School of Medicine, New Haven, CT.
authors.forename: M S
authors.initials: MS
authors.lastname: Huq
authors.forename: N
authors.initials: N
authors.lastname: Venkataramanan
authors.forename: J A
authors.initials: JA
authors.lastname: Meli
mesh_terms: D007854:Lead / Q000528:radiation effects*; D011829:Radiation Dosage; D012542:Scattering, Radiation; D014965:X-Rays
chemical_list: D007854:Lead