title: Recent studies of surface dynamic processes by reflection electron microscopy.
abstract: Reflection electron microscope studies of surface dynamic processes are reviewed and illustrated with recent new observations. They include: surface electromigration and current dependent structures of Si surfaces; surface etching by oxidation of Si surface; and growth of two dimensional alloyed adsorbate by co-deposition of metals on Si surface. The observations revealed details of the surface dynamic processes, which are difficult to obtain with other surface analysis techniques.
authors.affiliation: Physics Department, Tokyo Institute of Technology, Japan.
authors.forename: K
authors.initials: K
authors.lastname: Yagi
authors.forename: A
authors.initials: A
authors.lastname: Yamanaka
authors.forename: I
authors.initials: I
authors.lastname: Homma
mesh_terms: D000327:Adsorption; D000497:Alloys; D004563:Electrochemistry; D007204:Indium / Q000737:chemistry; D008854:Microscopy, Electron / Q000379:methods*; D010100:Oxygen; D012825:Silicon / Q000737:chemistry; D013499:Surface Properties
chemical_list: D000497:Alloys; D007204:Indium; D010100:Oxygen; D012825:Silicon