Comparative study of ion milling techniques in cross-sectional transmission electron microscope specimen preparation.
Zielinski
E M
EM
Intel Corporation, Santa Clara, California 95052-8126.
Tracy
B
B
D000535:Aluminum / Q000737:chemistry; D016591:Histocytological Preparation Techniques; D007477:Ions; D008854:Microscopy, Electron / Q000379:methods*; D013048:Specimen Handling; D014025:Titanium / Q000737:chemistry; D014414:Tungsten / Q000737:chemistry
D007477:Ions; D000535:Aluminum; D014025:Titanium; D014414:Tungsten