title: Scanning electron microscopic and energy-dispersive X-ray analysis findings on two brand new intraocular lenses.
abstract: Two intraocular lenses (IOLs) from the same manufacturer showed surface particles by scanning electron microscopy. With energy-dispersive X-ray analysis, these were shown to contain Mg-Si, Al-Mg-Si, Ti, Fe, Ca and Cu. A sterile chronic intraocular inflammation may result from implantation of such contaminated IOLs.
authors.affiliation: Department of Ophthalmology, RWTH Aachen, FRG.
authors.forename: N F
authors.initials: NF
authors.lastname: Schrage
authors.forename: M
authors.initials: M
authors.lastname: Reim
authors.forename: W G
authors.initials: WG
authors.lastname: Burchard
authors.forename: C
authors.initials: C
authors.lastname: Teping
authors.forename: M
authors.initials: M
authors.lastname: Wenzel
mesh_terms: D000838:Anions / Q000032:analysis; D002412:Cations / Q000032:analysis; D004577:Electron Probe Microanalysis / Q000379:methods; D007910:Lenses, Intraocular; D008855:Microscopy, Electron, Scanning; D013499:Surface Properties
chemical_list: D000838:Anions; D002412:Cations