Technique for preparing cross-section transmission electron microscope specimens from ion-irradiated ceramics.
The general techniques necessary to produce a high-quality cross-sectioned ceramic specimen for transmission electron microscope observation are outlined. A particularly important point is that the width of the glued region between faces of the ceramic specimen must be less than 0.2 micron to prevent loss of the near-surface region during ion milling. A recently developed vise for gluing ceramic cross-section specimens is described, and some examples of the effect of glue thickness on specimen quality are shown.
Zinkle
S J
SJ
Metals and Ceramics Division, Oak Ridge National Laboratory, Tennessee 37831-6376.
Haltom
C P
CP
Jenkins
L C
LC
DuBose
C K
CK
D002138:Calibration; D002516:Ceramics; D007477:Ions; D008854:Microscopy, Electron / Q000379:methods*; D013048:Specimen Handling / Q000379:methods*; D013314:Stress, Mechanical
D007477:Ions