title: Technique for preparing cross-section transmission electron microscope specimens from ion-irradiated ceramics.
abstract: The general techniques necessary to produce a high-quality cross-sectioned ceramic specimen for transmission electron microscope observation are outlined. A particularly important point is that the width of the glued region between faces of the ceramic specimen must be less than 0.2 micron to prevent loss of the near-surface region during ion milling. A recently developed vise for gluing ceramic cross-section specimens is described, and some examples of the effect of glue thickness on specimen quality are shown.
authors.affiliation: Metals and Ceramics Division, Oak Ridge National Laboratory, Tennessee 37831-6376.
authors.forename: S J
authors.initials: SJ
authors.lastname: Zinkle
authors.forename: C P
authors.initials: CP
authors.lastname: Haltom
authors.forename: L C
authors.initials: LC
authors.lastname: Jenkins
authors.forename: C K
authors.initials: CK
authors.lastname: DuBose
mesh_terms: D002138:Calibration; D002516:Ceramics; D007477:Ions; D008854:Microscopy, Electron / Q000379:methods*; D013048:Specimen Handling / Q000379:methods*; D013314:Stress, Mechanical
chemical_list: D007477:Ions