Intraoperative retinal light damage reflected in electrophysiologic data.
In a series of 30 unilaterally pseudophakic patients, electroretinograms and electrooculograms were recorded 6 months postoperatively. The unoperated on fellow eyes served as controls. High intraoperative retinal light exposure (3.4-7.3 mW/cm2, Zeiss OPMI6 operating microscope) caused a substantial reduction of electrophysiologic potentials. Light protection prevented deterioration of electroretinogram and electro-oculogram potentials; reducing the bulb voltage, tilting the axis of illumination, filtering short wavelengths and the use of light shields resulted in 4-log-unit lower intensities (0.8-3.7 microW/cm2).
Department of Ophthalmology, University of Vienna, Austria.
M
M
Lessel
A
A
Thaler
P
P
Heilig
W
W
Jantsch
V
V
Scheiber
D000368:Aged; D000369:Aged, 80 and over; D002387:Cataract Extraction; D004585:Electrooculography; D004594:Electrophysiology; D004596:Electroretinography; D005260:Female; D006801:Humans; D007431:Intraoperative Complications / Q000503:physiopathology*; D007910:Lenses, Intraocular; D008027:Light / Q000009:adverse effects*; D008297:Male; D008853:Microscopy; D008875:Middle Aged; D010786:Photoreceptor Cells / Q000502:physiology; D012164:Retinal Diseases / Q000175:diagnosis / Q000209:etiology / Q000503:physiopathology*