title: Extending the limit of atomic level grain boundary structure imaging using high-resolution electron microscopy.
abstract: It has been possible to image sigma = 21/[111]21.8 degrees tilt boundaries in thin Au films and to deduce their atomic arrangements. These results represent an electron microscopic resolution level of 1.43 A, attainable with a small amount of image processing, which produces interpretable structure images. This substantial improvement over other recent grain boundary studies, which required about 1.9-2.0 A resolution, clearly demonstrates that many more tilt grain boundary orientations are now accessible instead of a limited subset.
authors.affiliation: IBM Research Division, T. J. Watson Research Center, Yorktown Heights, New York 10598.
authors.forename: W
authors.initials: W
authors.lastname: Krakow
mesh_terms: D006046:Gold; D008854:Microscopy, Electron / Q000379:methods*; D008961:Models, Structural
chemical_list: D006046:Gold