title: Transmission electron microscope in situ fatigue experiments: a computer-control approach.
abstract: A computer-control procedure was developed to facilitate in situ fatigue experiments within an intermediate voltage transmission electron microscope using a goniometer-type straining holder. The procedure was designed to allow sine-wave tension-tension cyclic loading of a microfatigue specimen similar in geometry to a center-crack panel fatigue specimen. Computer control allows greater freedom for the operator to control the experiments while providing better reproducibility from one test to another. Further development of this procedure is possible by coupling this computer-control technique with computer-controlled stage motion and digitized TV imaging.
authors.affiliation: Department of Applied Mechanics and Engineering Sciences, University of California, San Diego, La Jolla 92093.
authors.forename: K S
authors.initials: KS
authors.lastname: Vecchio
authors.forename: J A
authors.initials: JA
authors.lastname: Hunt
authors.forename: D B
authors.initials: DB
authors.lastname: Williams
mesh_terms: D001330:Electronic Data Processing; D008854:Microscopy, Electron; D013690:Television