title: Structural characteristics of staircase-type Retzius lines in human dental enamel analyzed by scanning electron microscopy.
abstract: Based on a scanning electron microscopic (SEM) analysis of adjoining, acid-etched planes cut through human cervical enamel, the structural characteristics of staircase-type Retzius lines have been clarified. Structural features associated with this type of Retzius lines--such as cleftlike defects, decreased dimension of prisms, increased interprism, club-shaped appearance of prisms, oblique ridges, and triangular regions--have been incorporated into a unifying, three-dimensional model. A continuous discontinuity defect, involving both prisms and interprism, is a prominent feature of this type of Retzius lines. Prisms and interprism facing the deep aspect of the cleftlike defect show an enlarged, flat surface that encroaches on the cervically situated prisms being rebuilt from the same cleft. The initial part of a prism taking off from the cleft is of distorted shape. As the prism reaches the level of the interprism cleft, it abruptly regains its normal size and shape. The relationship between this type of Retzius lines and the carious process is discussed, and it is suggested that the discontinuity defect may retard the carious lesion due to a protective effect of its supposed organic content. The developmental events creating staircase-type Retzius lines are discussed, and it is suggested that Tomes' processes are constricted near their bases with a corresponding increase in interprismatic growth region. Tomes' processes will have to reshape plastically as they move out of the constricted pits, trailing the parent ameloblasts as they resume enamel production and move in the direction of the prisms.
authors.affiliation: Department of Anatomy, Dental Faculty, University of Oslo, Norway.
authors.forename: S
authors.initials: S
authors.lastname: Risnes
mesh_terms: D000566:Amelogenesis; D003743:Dental Enamel / Q000378:metabolism / Q000648:ultrastructure*; D006801:Humans; D008855:Microscopy, Electron, Scanning