title: Utility of the Stanford-Binet IV Abbreviated Form for placing exceptional children.
abstract: Stanford-Binet IV General Purpose Abbreviated Battery Scores were extracted from full battery administrations given to 19 developmentally handicapped children in a naturally occurring sample. The Pearson correlation with complete test Composite Scores was .94 (p less than .001). Short-form scores were higher in 47%, lower in 21%, and the same in 32% of the cases.
authors.forename: J E
authors.initials: JE
authors.lastname: DeLamatre
authors.forename: C L
authors.initials: CL
authors.lastname: Hollinger
mesh_terms: D000293:Adolescent; D002648:Child; D002671:Child, Exceptional / Q000193:education* / Q000523:psychology; D004495:Education of Persons with Intellectual Disabilities; D004519:Education, Special; D005260:Female; D006801:Humans; D007859:Learning Disabilities / Q000175:diagnosis* / Q000523:psychology; D008297:Male; D011594:Psychometrics; D012017:Referral and Consultation; D013195:Stanford-Binet Test