Scanning image detection (SID) system for conventional transmission electron microscope (CTEM) images.
A new image detection system has been developed to display transmission electron microscope (TEM) images on a CRT without a video camera system. Deflection coils placed in both the upper space of an objective lens and in the lower space of the first intermediate lens scan a small electron probe simultaneously. The electrical signal acquired through an improved scintillator and a photomultiplier is synchronized with the scanning signal and displayed in a similar fashion to a conventional scanning TEM (STEM) instrument. A preliminary system using a 100 kV conventional TEM (CTEM) equipped with a hairpin-type electron gun, produced an image with a spatial resolution of 1 nm.
Tanji
T
T
Research Institute for Scientific Measurements Tohoku University, Sendai, Japan.
Tomita
M
M
Kobayashi
H
H
D007091:Image Processing, Computer-Assisted / Q000295:instrumentation / Q000379:methods*; D008277:Magnesium Oxide; D008854:Microscopy, Electron / Q000379:methods*
D008277:Magnesium Oxide