title: Resolution as a function of accelerating voltage in electron microscopy of semithick biological specimens.
abstract: In the past, biological sections ranging in thickness from 0.10- to 0.50-micron have usually been examined with high-voltage (greater than 500 kV) electron microscopes (HVEM). Now investigators are increasingly using intermediate voltage (200-500 kV) electron microscopes (IVEM), which are more readily available and demand less maintenance. In a study of "typical" plastic-embedded, stained sections of mouse liver ranging from 0.10 to 1.0 micron thick, we determined the resolution obtainable at 100, 200, and 1000 kV. At all three accelerating voltages the resolution (2.7 nm) for 0.10-micron sections was limited only by the sections stain granularity. For 0.25-micron thickness the resolutions were 5.8, 3.1, and 3.1 nm at 100, 200, and 1000 kV, respectively. The maximum usable thickness at 200 kV with resolution sufficient to resolve membranes clearly was between 0.75 and 1.0 micron, depending on the magnification. Resolution at 100 kV was adequate for screening sections up to 1.0-micron thick for preparation defects prior to examination with an IVEM or HVEM.
authors: High-Voltage Electron Microscope Biotechnology Resource, Wadsworth Center for Laboratories and Research, New York State Department of Health, Albany 12201.
authors: R W
authors: RW
authors: Cole
authors: D F
authors: DF
authors: Parsons
mesh_terms: D000818:Animals; D002869:Chromosome Aberrations; D004560:Electricity; D006652:Histological Techniques; D008099:Liver / Q000648:ultrastructure*; D051379:Mice; D008854:Microscopy, Electron / Q000379:methods*