Measurement of lattice parameter and strain using convergent beam electron diffraction.
A brief review is presented of the methods of measuring lattice parameters and strain using diffraction techniques. The presence of strain leads to broadening of diffraction maxima, which is normally separable from any broadening caused by size. The special advantages of the convergent beam electron diffraction (CBED) technique is the local nature from which the data are derived. Examples of the use of CBED techniques in measuring lattice parameters and strain are given from studies of precipitation (including misfit measurements) and from investigations of partially recrystallised microstructures. These examples are used to illustrate the advantages and limitations of the CBED technique.
Randle
V
V
Department of Materials Technology, Brunel University of West London, Middlesex, England.
Barker
I
I
Ralph
B
B
D003461:Crystallography / Q000379:methods*; D004583:Electrons; D008854:Microscopy, Electron / Q000379:methods*; D008855:Microscopy, Electron, Scanning; D012542:Scattering, Radiation