title: Quantitative analytical electron microscopy of multiphase alloys.
abstract: In this paper, we present a technique for analysis of composition gradients, using an analytical electron microscope, within the primary phase of a two-phase alloy for the case where the second-phase particle size is similar to the size of the irradiated volume. If the composition difference between the two phases is large, the detected compositional fluctuations associated with varying phase fractions may mask any underlying composition gradient of the primary phase. The analysis technique was used to determine grain boundary chromium concentration gradients in a nickel-base superalloy, alloy X-750. The technique may also be of use in other alloy systems.
authors.affiliation: General Electric Company, Schenectady, New York 12301.
authors.forename: J
authors.initials: J
authors.lastname: Prybylowski
authors.forename: R
authors.initials: R
authors.lastname: Ballinger
authors.forename: C
authors.initials: C
authors.lastname: Elliott
mesh_terms: D002858:Chromium Alloys / Q000032:analysis*; D008433:Mathematics; D008854:Microscopy, Electron / Q000379:methods*
chemical_list: D002858:Chromium Alloys