Filtered dark-field and pure Z-contrast: two novel imaging modes in a Scanning Transmission Electron Microscope.
For the investigation of biological objects with a Scanning Transmission Electron Microscope (STEM) the dark-field imaging mode is the one used most often. We will show, regarding calculations that we have done which took into account the finite angle of the illumination and multiple scattering processes, that the collected amount of inelastically scattered electrons with an annular dark-field detector is higher then normally expected. According to the above calculations, we designed a new detection system to enable us to acquire three different images (inelastic, filtered dark-field and filtered bright-field) simultaneously.
Haider
M
M
European Molecular Biology Laboratory, Heidelberg, Fed. Rep. of Germany.
D008433:Mathematics; D008855:Microscopy, Electron, Scanning / Q000379:methods*