title: An application of high-resolution transmission electron microscopy to the study of the fine structure of dislocations in potassium feldspars.
abstract: An application of high-resolution transmission electron microscopy (HRTEM) to the study of two types of dislocations in potassium feldspars (K-feldspars) is shown here. HRTEM images were submitted to a filtering in order to improve their interpretation. One type of dislocation--(010)[001]--appears to be dissociated, with (010)[001]/2 planar defect, whereas the other one--(010)[110]/2--is perfect. This result helps provide an understanding of dislocation activation in this material.
authors.affiliation: Laboratoire de Minéralogie-Cristallographie, associé au CNRS, Universités P. et M. Curie, Paris, France.
authors.forename: Y L
authors.initials: YL
authors.lastname: Zheng
authors.forename: M
authors.initials: M
authors.lastname: Gandais
mesh_terms: D000538:Aluminum Silicates / Q000032:analysis*; D008854:Microscopy, Electron / Q000379:methods*; D011188:Potassium / Q000032:analysis*; D017680:Potassium Compounds
chemical_list: D000538:Aluminum Silicates; D017680:Potassium Compounds; C016447:feldspar; D011188:Potassium