Study of local atomic order in amorphous materials in a computerized transmission electron microscope.
Experimental results obtained by electron diffraction (ED) and extended electron energy loss fine structure (EXELFS) techniques to study the local atomic order in amorphous materials such as carbon, silicon, and its oxides are described. Potential applications of ED and EXELFS techniques and their limitations are also discussed.
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Laboratoire de Microscopie Electronique, U.F.R. Sciences, INSERM U 314, Reims, France.
Garg
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RK
Bonhomme
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Thomas
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D003201:Computers; D008433:Mathematics; D008854:Microscopy, Electron / Q000295:instrumentation / Q000379:methods*