Practical phase identification by convergent beam electron diffraction.
The purpose of this article is to present a practical guide to the identification of phases in the analytical electron microscope with the aid of convergent beam electron diffraction. There is included a step-by-step approach to phase analysis, from the possible choices of the form of the specimen through how to explore reciprocal space in order to perform a full phase identification, either by symmetry analysis or by simple comparison of a pattern observed in the microscope with a previously recorded pattern (fingerprinting). There is a strong emphasis on practical hints and useful shortcuts.
North Campus Electron Microbeam Analysis Laboratory, University of Michigan, Ann Arbor 48109-2143.
J
J
Mansfield
D003461:Crystallography / Q000379:methods; D004583:Electrons; D008854:Microscopy, Electron / Q000379:methods*; D013048:Specimen Handling