A high-voltage scanning transmission electron microscope at Nagoya University.
A high-voltage scanning transmission electron microscope (STEM) H-1250ST of the maximum accelerating voltage of 1.25 MV was constructed at Nagoya University in 1983. The microscope, equipped with a field-emission gun, is designed with high-level STEM performance as well as conventional transmission microscopy mode operation. The aim of developing the microscope, basic design schemes, principal instrumentation, and techniques developed are described.
Hibino
M
M
Department of Electronics, Faculty of Engineering, Nagoya University, Japan.
Shimoyama
H
H
Maruse
S
S
D007564:Japan; D008855:Microscopy, Electron, Scanning / Q000295:instrumentation* / Q000379:methods