title: A high-voltage scanning transmission electron microscope at Nagoya University.
abstract: A high-voltage scanning transmission electron microscope (STEM) H-1250ST of the maximum accelerating voltage of 1.25 MV was constructed at Nagoya University in 1983. The microscope, equipped with a field-emission gun, is designed with high-level STEM performance as well as conventional transmission microscopy mode operation. The aim of developing the microscope, basic design schemes, principal instrumentation, and techniques developed are described.
authors: Department of Electronics, Faculty of Engineering, Nagoya University, Japan.
authors: M
authors: M
authors: Hibino
authors: H
authors: H
authors: Shimoyama
authors: S
authors: S
authors: Maruse
mesh_terms: D007564:Japan; D008855:Microscopy, Electron, Scanning / Q000295:instrumentation* / Q000379:methods