title: Detection of small displacement of atoms in crystals by atom resolution electron microscopy.
abstract: Four kinds of works on the detection of displacement of atoms in crystals are shown. The irregular small displacement of atoms has been detected, with an accuracy of about 0.1 A around dislocations and stacking faults in Au crystals as shown by their electron microscope images. The displacement of the atomic images is recorded by aberration-free focus (AFF). Even when the periodic displacement of atoms in SiC and TaS2 crystals is around 0.1% of the lattice constant, this displacement has been revealed as the weak-contrast anomaly in the images. Using in situ observations by a TV system attached to an electron microscope, the rapid movements of atoms that have taken place within 1/30 sec have been recorded. Using the technique of successive subtraction of the images by TV system and image sigma, only the images of moving atoms in Au crystal have been recorded each 1/10 sec.
authors: Department of Mechanical Engineering, Faculty of Engineering, Okayama University of Science, Japan.
authors: H
authors: H
authors: Hashimoto
authors: M
authors: M
authors: Kuwabara
authors: Y
authors: Y
authors: Takai
authors: S
authors: S
authors: Tsubokawa
authors: Y
authors: Y
authors: Yokota
mesh_terms: D055598:Chemical Phenomena; D002621:Chemistry; D003460:Crystallization; D006046:Gold / Q000032:analysis; D007091:Image Processing, Computer-Assisted; D008433:Mathematics; D008854:Microscopy, Electron / Q000379:methods*; D015394:Molecular Structure; D012825:Silicon / Q000032:analysis; D013635:Tantalum / Q000032:analysis
chemical_list: D013635:Tantalum; D006046:Gold; D012825:Silicon