title: High-resolution transmission electron microscopy of inorganic materials in cellular and topological random systems.
abstract: The structure of amorphous Se films, in the topological random system, has been studied by the computer-simulation, electron diffraction (ED), and high-resolution transmission electron microscopy (HRTEM). As an example of HRTEM of the cellular random system, our recent investigation on Ba-ferrites is reviewed beforehand. In HRTEM images of spin-glass BaTi2-xSnxFe4O11 (x less than 0.6), magnetic clusters or clusters of FeO6-octahedra surrounded by TiO6-octahedra have been found. The structure of BaSn2Fe4O11 (x = 2) has been determined. The ordering of Sn (Ti) and Fe ions increases with increasing x, which interprets the change from the spin-glass state to nonspin-glass state at x = 0.6. It is shown that a cluster of polarized lattice ions is detectable in images of polar-glass BaxK2-xFexTi6-xO13 (x greater than or equal to 1.2). The structure models of amorphous Se films forming on a substrate have been constructed on a computer, and their radial distribution function (RDF) and HRTEM images have been calculated. Experimental RDF and HRTEM images have been obtained from vacuum-deposited amorphous Se films and are compared with the calculated ones. It is concluded that in the as-deposited films most of Se molecules may be composed of Se atoms as small as three and that by the electron-beam irradiation the molecules link to form spiral chains in amorphous state and then arrange to have the hexagonal crystal structure.
authors: Department of Physics, Kyoto Institute of Technology, Japan.
authors: M
authors: M
authors: Shiojiri
authors: Y
authors: Y
authors: Hirota
authors: T
authors: T
authors: Isshiki
authors: K
authors: K
authors: Okashita
authors: S
authors: S
authors: Sekimoto
mesh_terms: D055598:Chemical Phenomena; D002621:Chemistry; D003198:Computer Simulation; D003460:Crystallization; D008854:Microscopy, Electron / Q000379:methods; D015394:Molecular Structure; D012643:Selenium / Q000032:analysis*; D014961:X-Ray Diffraction
chemical_list: D012643:Selenium