title: Effect of primary beam energy on the secondary ion sputtering efficiency of liquid secondary ionization mass spectrometry in the 5-30-keV range.
authors.forename: W H
authors.initials: WH
authors.lastname: Aberth
authors.forename: A L
authors.initials: AL
authors.lastname: Burlingame
mesh_terms: D000818:Animals; D005936:Glucans / Q000032:analysis; D006801:Humans; D007328:Insulin / Q000032:analysis; D013058:Mass Spectrometry / Q000295:instrumentation*
chemical_list: D005936:Glucans; D007328:Insulin