title: Image registration in electron microscopy: application of a robust method.
abstract: The geometric registration of two electron microscopic images generally is performed by maximizing the cross-correlation coefficient between them. We show that a new similarity measure (the number of sign changes) is useful for performing simultaneously geometric and gray-level registration. This method is robust, which means that it provides a good estimation of the parameters even in the presence of outliers that cannot be described by the registration model.
authors.affiliation: Laboratoire de Microscopie Electronique (Unité INSERM 314) BP 347-Reims, France.
authors.forename: N
authors.initials: N
authors.lastname: Bonnet
authors.forename: J C
authors.initials: JC
authors.lastname: Liehn
mesh_terms: D003198:Computer Simulation; D007091:Image Processing, Computer-Assisted / Q000379:methods*; D008854:Microscopy, Electron / Q000379:methods*; D008855:Microscopy, Electron, Scanning / Q000379:methods