High-resolution electron microscopy image simulation on a Cray 1S/2300 computer.
High-resolution electron microscopy (HREM) image simulation by the multislice method has been implemented on a Cray 1S/2300 computer, allowing accurate full nonlinear image intensity calculations with possible sampling up to 2n x 2m samples of the transmission function (n + m = 20). As examples of applications, images have been obtained from an interface in PbTiO3 and of a small gold aggregate. HREM image simulation of perfect or faulted crystals can now be applied with reasonable computing times to problems involving a large number of atoms and thick or large supercells.
Spycher
R
R
Institut Interdepartémental de Microscopie Electronique, EPFL, Swiss Institute of Technology, Lausanne.
Stadelmann
P
P
Buffat
P
P
Flueli
M
M
D003460:Crystallization; D006046:Gold; D007091:Image Processing, Computer-Assisted / Q000295:instrumentation / Q000379:methods*; D008433:Mathematics; D008854:Microscopy, Electron / Q000379:methods*; D015394:Molecular Structure
D006046:Gold