title: High-resolution electron microscopy image simulation on a Cray 1S/2300 computer.
abstract: High-resolution electron microscopy (HREM) image simulation by the multislice method has been implemented on a Cray 1S/2300 computer, allowing accurate full nonlinear image intensity calculations with possible sampling up to 2n x 2m samples of the transmission function (n + m = 20). As examples of applications, images have been obtained from an interface in PbTiO3 and of a small gold aggregate. HREM image simulation of perfect or faulted crystals can now be applied with reasonable computing times to problems involving a large number of atoms and thick or large supercells.
authors.affiliation: Institut Interdepartémental de Microscopie Electronique, EPFL, Swiss Institute of Technology, Lausanne.
authors.forename: R
authors.initials: R
authors.lastname: Spycher
authors.forename: P
authors.initials: P
authors.lastname: Stadelmann
authors.forename: P
authors.initials: P
authors.lastname: Buffat
authors.forename: M
authors.initials: M
authors.lastname: Flueli
mesh_terms: D003460:Crystallization; D006046:Gold; D007091:Image Processing, Computer-Assisted / Q000295:instrumentation / Q000379:methods*; D008433:Mathematics; D008854:Microscopy, Electron / Q000379:methods*; D015394:Molecular Structure
chemical_list: D006046:Gold