title: Cross-sectional TEM specimens of metal contacts to semiconductors.
authors.affiliation: Department of Mining, Metallurgical and Petroleum Engineering, University of Alberta, Edmonton, Canada.
authors.forename: D G
authors.initials: DG
authors.lastname: Ivey
authors.forename: G R
authors.initials: GR
authors.lastname: Piercy
mesh_terms: D002857:Chromium; D006046:Gold; D008670:Metals / Q000032:analysis*; D008854:Microscopy, Electron / Q000379:methods*; D012666:Semiconductors
chemical_list: D008670:Metals; D002857:Chromium; D006046:Gold