title: Contribution of a photoreactivable component to the oxygen effect observed in certain rad mutants of Saccharomyces cerevisiae after exposure to high energy electrons.
abstract: It is shown that a fraction of damage induced by high energy electrons (25 MeV) in certain rad mutants of the yeast Saccharomyces cerevisiae can be photoreactivated. The photoreactivable damage contributes to the lethal effect of this type of irradiation and modifies the oxygen effect. Using photoreactivating light or nigrosin, the amount of photoreactivable damage is reduced and the oxygen enhancement ratio (OER) for yeast mutants increases approximately to the OER found in wild-type cells.
authors.forename: T S
authors.initials: TS
authors.lastname: Tsyb
authors.forename: N G
authors.initials: NG
authors.lastname: Selyova
authors.forename: N M
authors.initials: NM
authors.lastname: Kabakova
authors.forename: M N
authors.initials: MN
authors.lastname: Myasnik
authors.forename: O N
authors.initials: ON
authors.lastname: Pakhomova
mesh_terms: D000332:Aerobiosis; D000693:Anaerobiosis; D004260:DNA Repair; D004307:Dose-Response Relationship, Radiation; D004583:Electrons; D009154:Mutation; D010100:Oxygen / Q000633:toxicity; D012441:Saccharomyces cerevisiae / Q000235:genetics / Q000528:radiation effects*; D014466:Ultraviolet Rays
chemical_list: D010100:Oxygen