title: Possible occurrence of DNA double-strand breaks during repair of u.v.-induced damage in yeast.
abstract: The yeast mutant rad54-3, which is temperature conditional for dsb rejoining, is sensitive to u.v. light when held at the restrictive temperature following exposure. We propose that this is attributable to the enzymatic formation of dsb in DNA containing u.v. lesions and a subsequent lack of dsb repair in this mutant.
authors.forename: M
authors.initials: M
authors.lastname: Frankenberg-Schwager
authors.forename: D
authors.initials: D
authors.lastname: Frankenberg
authors.forename: R
authors.initials: R
authors.lastname: Harbich
mesh_terms: D004249:DNA Damage; D011088:DNA Ligases / Q000378:metabolism; D004260:DNA Repair; D004271:DNA, Fungal / Q000528:radiation effects*; D004307:Dose-Response Relationship, Radiation; D005656:Fungal Proteins / Q000378:metabolism; D011836:Radiation Tolerance; D012441:Saccharomyces cerevisiae / Q000235:genetics / Q000378:metabolism / Q000528:radiation effects*; D013696:Temperature; D014466:Ultraviolet Rays
chemical_list: D004271:DNA, Fungal; D005656:Fungal Proteins; D011088:DNA Ligases