title: Low temperature scanning electron microscopy: advantages and applications.
abstract: Cryo-preparation of specimens for scanning electron microscopy can be completed within a few minutes. Chemical fixation and contact with solvents is avoided, levels of specimen hydration are maintained, low melting-point materials are stabilized, volume changes are minimized and internal structure can be revealed by freeze-fracture. Elements are not lost or substantially relocated prior to X-ray microanalysis and specimen luminescence is enhanced. The displacement of internal structure and material subject to X-ray microanalysis by the growth of ice crystals in hydrated samples can be minimized by adopting fast freezing methods designed to limit ice crystal growth. The technique enables a wide range of industrial and biological materials to be examined rapidly and free from artifacts commonly associated with more conventional preparation methods.
authors.affiliation: Hexland Electron Microscopy Division, Oxford Instruments Limited, Eynsham, U.K.
authors.forename: J A
authors.initials: JA
authors.lastname: Sargent
mesh_terms: D000818:Animals; D005613:Freeze Etching; D005615:Freezing; D008855:Microscopy, Electron, Scanning / Q000295:instrumentation / Q000379:methods*; D009061:Mouth Mucosa / Q000648:ultrastructure; D010944:Plants / Q000648:ultrastructure; D012867:Skin / Q000648:ultrastructure; D014059:Tongue / Q000648:ultrastructure