title: The microstructural basis of creep of gamma 1 in dental amalgam.
abstract: A previous study has shown that the addition of small amounts of tin to gamma 1 leads to the formation of a SnHg intergranular precipitate. The purpose of this study was to determine the effect of this precipitate on the creep of gamma 1. Two groups of samples were investigated. Group I included a series of gamma 1 samples with 0, 1, 2, and 3 wt% Sn fabricated by a sintering technique at 55 degrees C and 125 mN/m2 for 72 h. Group II contained the same samples as in Group I that were further annealed at 60 degrees C for 2000 h. Annealing was carried out to allow gamma 1 grain growth and equilibrium distribution of Sn at grain boundaries. Creep tests were conducted according to the American Dental Association Specification 1. The microstructures of all samples were characterized by scanning electron microscopy. The creep of gamma 1 was found to be controlled by the intergranular precipitate when the Sn concentration was above 1%. For a specific concentration of Sn, i.e. the intergranular precipitate, creep was dependent on the distribution of Sn and not on the gamma 1 grain size. The more nearly continuous precipitates found in annealed samples favoured higher creep.
authors.forename: N K
authors.initials: NK
authors.lastname: Sarkar
authors.forename: C S
authors.initials: CS
authors.lastname: Eyer
mesh_terms: D055598:Chemical Phenomena; D002627:Chemistry, Physical; D003723:Dental Amalgam; D008855:Microscopy, Electron, Scanning; D013499:Surface Properties; D014001:Tin
chemical_list: D014001:Tin; D003723:Dental Amalgam