Computer software for specimen orientation adjustment using double-tilt or rotation holders.
Computer software for specimen orientation adjustment relative to the incident electron beam has been developed. The difficulties encountered when tilting severely strained, highly beam-sensitive, or small-grain-size specimens with known structures using either a double-tilt or a rotation holder in transmission electron microscopy (TEM) can be minimized. Combined with computer programs for obtaining the reduced bases from diffraction patterns, the software is also useful for unknown crystals. The algorithm is introduced and examples are given.
D003460:Crystallization; D008433:Mathematics; D008854:Microscopy, Electron / Q000295:instrumentation / Q000379:methods*; D012984:Software