K-edge effect calibration of the Ge(Li)/Si(Li)-multichannel analyser system.
The positions of the steps produced in the spectral distribution of a bremsstrahlung beam by a mixture of powdered substances, give a single measurement calibration of the Ge(Li)/Si(Li)-multichannel analyser system as reported here. Through a set of linear equations, from the step heights one gets a chemical analysis of the mixture, or pointwise the spectral distribution of the primary X-ray beam.
D002138:Calibration; D005857:Germanium; D008094:Lithium; D011874:Radiometry / Q000295:instrumentation*; D012666:Semiconductors; D012825:Silicon
D005857:Germanium; D008094:Lithium; D012825:Silicon