title: [Total materials characterization with the scanning electron microscope (author's transl)].
mesh_terms: D008163:Luminescent Measurements; D008722:Methods; D008855:Microscopy, Electron, Scanning / Q000295:instrumentation; D011827:Radiation; D013057:Spectrum Analysis
vernacular_title: Umfassende Material-Charakterisierung mit dem Raster-Elektronenmikroskop.