Solid-state energy-dispersion spectrometer for electron-microprobe x-ray analysis.
Improved lithium-drifted silicon solid-state detectors allow detection and energy dispersion of x-rays of about 3 to 30 kiloelectron volts in the electron-microprobe x-ray analyzer. Energy resolution is sufficient to separate peaks of characteristic x-rays of elements adjacent in the periodic system at atomic number 20 and higher. The detected x-ray spectrum emitted from an unknown sample can be recorded with a multichannel analyzer in approximately 60 seconds.
D004577:Electron Probe Microanalysis / Q000295:instrumentation; D004583:Electrons; D008094:Lithium; D012825:Silicon; D013057:Spectrum Analysis / Q000295:instrumentation*
D008094:Lithium; D012825:Silicon