The interpretation of low-angle X-ray data from planar and concentric multilayered structures. The use of one-dimensional electron density strip models.
The use of one-dimensional electron density strip models in interpreting low-angle X-ray data from planar and concentric multilayered structures is described. Diffraction formulas for an n-strip model are given. Fourier transforms, normalization constants, and Patterson functions are derived for certain strip models.
D004583:Electrons; D008566:Membranes / Q000032:analysis*; D008962:Models, Theoretical; D014961:X-Ray Diffraction