title: An x-ray spectrometric technique for measuring porcelain-metal adherence.
abstract: This study demonstrated a correlation between silicon x-ray counts and area fractions of adherent porcelain as determined by point-counting. This correlation has allowed a method to be devised for measuring area fractions of porcelain adherent to porcelain-fused-to-metal (PFM) fracture surfaces. The described method, after controlled destruction of the porcelain mass, uses silicon x-rays excited by the electron beam in a scanning electron microscope. Under the conditions employed in these studies, the x-ray technique has shown that this gold alloy retains more porcelain than does either of two particular nickel-chromium alloys.
mesh_terms: D002858:Chromium Alloys; D003722:Dental Alloys; D001840:Dental Bonding; D003776:Dental Porcelain; D006047:Gold Alloys; D008855:Microscopy, Electron, Scanning; D013052:Spectrometry, X-Ray Emission; D013816:Thermodynamics
chemical_list: D002858:Chromium Alloys; D003722:Dental Alloys; D006047:Gold Alloys; D003776:Dental Porcelain