Rapid determination of organochlorine pesticides and polychlorinated biphenyls, using selected ion monitoring mass spectrometry.
Methane chemical ionization (CI)-selected ion monitoring (SIM) mass spectrometry was used to identify and conclusively distinguish 19 organochlorine pesticides from polychlorinated biphenyls (PCBs) at parts-per-trillion to parts-per-billion levels in environmental water sample extracts with minimal sample cleanup. Two CI-SIM screens were developed. One set of ions scanned specifically for the presence of 4 classes of pesticides: diphenylmethane derivatives, bridged polycyclic chlorinated hydrocarbons, chlorinated benzenes, and acetanilide pesticides. The second set of ions responded exclusively to PCBs with biphenyl moieties containing from 1 to 8 chlorine atoms. Eight commercial Aroclor mixtures were analyzed and distinguished from the pesticide groups. The detection limit for pesticides and PCBs by CI-SIM screening was 0.005 and 0.1 ppb, respectively. CI-SIM can be used as an alternative method for the analysis of biological or environmental samples containing interferences that complicate the detection of PCBs and chlorinated pesticides.
D005618:Fresh Water / Q000032:analysis; D007306:Insecticides / Q000032:analysis*; D007536:Isomerism; D013058:Mass Spectrometry / Q000379:methods; D011078:Polychlorinated Biphenyls / Q000032:analysis*; D014873:Water Pollutants / Q000032:analysis*; D014874:Water Pollutants, Chemical / Q000032:analysis*
D007306:Insecticides; D014873:Water Pollutants; D014874:Water Pollutants, Chemical; D011078:Polychlorinated Biphenyls