title: A statistical method for the analysis of quantitative thin-film X-ray microanalytical data.
abstract: A series of equations is presented through which thin-film X-ray microanalytical data may be characterized statistically. Test statistics based on the Gaussian distribution are than presented, together with examples of the use and evaluation of an empirically derived Mg/Ca working curve.
mesh_terms: D000818:Animals; D004577:Electron Probe Microanalysis; D006801:Humans; D008433:Mathematics; D008954:Models, Biological; D013223:Statistics as Topic