title: Backscatter from metal surfaces in diagnostic radiology.
abstract: Backscatter from four commonly used metals (aluminum, lead, copper, and iron) was measured under diagnostic imaging conditions, using screen-film systems as detectors. The results indicate that for an 80-kV filtered beam and Par Speed/XRP system, backscatter increases as aluminum (Al) thickness increases until it reaches a plateau of approximately 12% at 50 mm Al. The amount of backscatter from any of these four metals increases as the tube voltage is raised from 60 to 115 kV. Measured backscatter depends strongly on the screens used, possibly due to their attenuation and energy response. Backscatter from aluminum was significantly greater than that from the other metals tested.
mesh_terms: D000535:Aluminum; D007854:Lead; D008670:Metals; D011859:Radiography / Q000295:instrumentation*; D012542:Scattering, Radiation; D013679:Technology, Radiologic; D014962:X-Ray Film
chemical_list: D008670:Metals; D007854:Lead; D000535:Aluminum