title: X-ray microscopy using a scanning electron microscope for the purpose of imaging central nervous system structures.
abstract: A simple modification of an Hitachi S.450 specimen stage permits point source X-ray microscopy with a scanning electron microscope. Point source X-ray microscopy was applied to nervous tissue to determine the feasibility of utilizing this technique instead of a light microscope mounted camera lucida to produce 2- and 3-dimensional images of whole structures such as neurons. Various target materials, radio-opaque materials and photographic films were examined in this study.
mesh_terms: D000818:Animals; D002490:Central Nervous System / Q000648:ultrastructure*; D004577:Electron Probe Microanalysis / Q000295:instrumentation* / Q000592:standards; D008855:Microscopy, Electron, Scanning