title: Solid-phase immune electron microscopy (SPIEM) for rapid viral diagnosis.
abstract: Immune electron microscopy (IEM) is one of the fastest and most sensitive methods for the detection and diagnosis of viruses. This technique is based on formation of immune complexes of the virus with its corresponding antibody. In IEM optimal precipitation depends on a correct ratio, and there is a prozone effect. These problems can be overcome by using the solid-phase immune electron microscopic (SPIEM) technique. In this technique the antibody is attached to a particle which is used for 'fishing' the virus to be examined out of the suspension. After low speed centrifugation the preparation is treated either for observation in the transmission electron microscope or in the scanning electron microscope. In 'positive' samples the virus is seen attached to the surface of the particle. We report here results with S. aureus as the solid phase for the detection of Sindbis virus. The anti-Sindbis gamma globulins are attached to the bacteria by means of protein A present on their surface.
mesh_terms: D000937:Antigen-Antibody Reactions; D000956:Antigens, Viral / Q000276:immunology; D008854:Microscopy, Electron; D008855:Microscopy, Electron, Scanning / Q000379:methods*; D012845:Sindbis Virus / Q000276:immunology; D013211:Staphylococcus aureus / Q000648:ultrastructure; D014780:Viruses / Q000276:immunology / Q000302:isolation & purification*
chemical_list: D000956:Antigens, Viral