title: A utilization of the phase spectrum for the correction of image drift in high resolution transmission electron microscopy.
authors.affiliation: Department of Electrical Engineering, Kogakuin University, Tokyo, Japan.
authors.forename: N
authors.initials: N
authors.lastname: Ichise
authors.forename: M
authors.initials: M
authors.lastname: Ogasawara
authors.forename: N
authors.initials: N
authors.lastname: Baba
mesh_terms: D005583:Fourier Analysis; D007091:Image Processing, Computer-Assisted; D008854:Microscopy, Electron