title: Focused-ion-beam digging of biological specimens.
abstract: The focused ion beam (FIB) technique has been applied for digging damageable biological specimens of human hair and the housefly eye. Sharp cross-sections have been formed for these specimens and their cross-sectional structures have been observed in scanning ion microscope (SIM) images. The applicability of FIB has been confirmed for these biological specimens.
authors.affiliation: Instrument Division, Hitachi Ltd., Ibaraki, Japan.
authors.forename: T
authors.initials: T
authors.lastname: Ishitani
authors.forename: H
authors.initials: H
authors.lastname: Hirose
authors.forename: H
authors.initials: H
authors.lastname: Tsuboi
mesh_terms: D000818:Animals; D005123:Eye / Q000648:ultrastructure; D006197:Hair / Q000648:ultrastructure; D016591:Histocytological Preparation Techniques; D006793:Houseflies; D006801:Humans; D007477:Ions; D008855:Microscopy, Electron, Scanning / Q000379:methods*; D017956:Photoreceptor Cells, Invertebrate / Q000648:ultrastructure; D013499:Surface Properties
chemical_list: D007477:Ions