title: Heavy ion-induced DNA double-strand breaks with yeast as a model system.
abstract: Cells of diploid yeast, Saccharomyces cerevisiae, were exposed to a variety of energetic heavy ions (provided by the UNILAC facility at the Gesellschaft für Schwerionenforschung, GSI), 241Am alpha-particles and 80-keV x-rays after which they were assessed for DNA double-strand breaks (DSB) using either the neutral sedimentation or the pulsed-field gel electrophoresis (PFGE) technique. Both yielded comparable results. The DSB production cross-sections are compared with inactivation studies performed for the same cells under identical conditions. The measurements show that with lighter ions DSB induction cross-sections increase with linear energy transfer (LET), but the situation is less clear with the heavier ions. A close parallelism was found between DSB induction and cell inactivation in these yeast cells.
authors.affiliation: Strahlenzentrum der Justus-Liebig-Universität Giessen, Germany.
authors.forename: S
authors.initials: S
authors.lastname: Ikpeme
authors.forename: M
authors.initials: M
authors.lastname: Löbrich
authors.forename: T
authors.initials: T
authors.lastname: Akpa
authors.forename: E
authors.initials: E
authors.lastname: Schneider
authors.forename: J
authors.initials: J
authors.lastname: Kiefer
mesh_terms: D000512:Alpha Particles; D004247:DNA / Q000528:radiation effects*; D004249:DNA Damage; D016521:Electrophoresis, Gel, Pulsed-Field; D018499:Linear Energy Transfer; D012441:Saccharomyces cerevisiae / Q000235:genetics / Q000528:radiation effects*; D014965:X-Rays
chemical_list: D004247:DNA