X-ray scanning microanalysis of Sporothrix schenckii.
X-ray scanning microanalysis was applied to the study of fungal samples such as Sporothrix schenckii. This technique is sufficiently sensitive to detect many elements in the periodical classification of Mendeleev.
Thibaut
M
M
Laboratoire de Parasitologie et Mycologie, Paris, France.
D004577:Electron Probe Microanalysis / Q000295:instrumentation; D004602:Elements; D008855:Microscopy, Electron, Scanning / Q000295:instrumentation; D013175:Sporothrix / Q000737:chemistry* / Q000254:growth & development / Q000648:ultrastructure
D004602:Elements