title: Ultramicroanalysis of dental plaque films by total reflection X-ray fluorescence.
abstract: Microgram quantities of dental plaque were taken near amalgam fillings, gold crowns and intact teeth. Such extremely small samples can be analysed by total reflection X-ray fluorescence (TXRF), a fairly new variant of energy dispersive X-ray fluorescence (EDXRF). More than sixty samples were examined directly without chemical pretreatment. Fifteen elements of interest were detected simultaneously within a wide range of mass fraction and with detection limits of several mg/kg. A significant correlation of the Hg-accumulation in plaque and the amalgam fillings was established. Near these fillings Hg mass fractions can reach a level of 300 mg/kg. The results for other elements, e.g. Au, are less significant.
authors: Institut für Spektrochemie und angewandte Spektroskopie, Dortmund, Fed., Rep. of Germany.
authors: A
authors: A
authors: von Bohlen
authors: P
authors: P
authors: Rechmann
authors: J L
authors: JL
authors: Tourmann
authors: R
authors: R
authors: Klockenkämper
mesh_terms: D003198:Computer Simulation; D003723:Dental Amalgam / Q000378:metabolism*; D003773:Dental Plaque / Q000737:chemistry*; D006801:Humans; D007754:Laboratories, Dental; D008628:Mercury / Q000032:analysis* / Q000378:metabolism; D012016:Reference Values; D013052:Spectrometry, X-Ray Emission; D014131:Trace Elements / Q000032:analysis* / Q000378:metabolism
chemical_list: D014131:Trace Elements; D003723:Dental Amalgam; D008628:Mercury