Calculation of overall tilt angles for a double tilt holder in a TEM.
A simple formula has been derived for the tilt angle of a specimen in terms of the two tilt angles of a side entry, double tilt holder in a transmission electron microscope. An expression for calculating the direction of the apparent tilt axis in relation to the observed diffraction pattern has also been derived. The accuracy and reproducibility of specimen tilting has been assessed experimentally.
Kelly
P M
PM
Department of Mining and Metallurgical Engineering, University of Queensland, Australia.
Wauchope
C J
CJ
Zhang
X
X
D008433:Mathematics; D008854:Microscopy, Electron / Q000295:instrumentation* / Q000379:methods*